M2 Ø2 mm silicon nitride ball, tungsten carbide stem, L 30 mm, EWL 22.5 mm A-5003-7573 CAL14 B4 Inspec Vee Anvil Micrometers

Inspec Vee Anvil Micrometers

MPE measuring range: 20 µm

12AAL067 RS-232C cable for printer for Surftest SJ-210

cleaning paper

Repeatability: 0

M2 Ø2 mm silicon nitride ball, tungsten carbide stem, L 30 mm, EWL 22.5 mm A-5003-7573 CAL14 B4 Inspec Vee Anvil MicrometersRenishaw M2 Straight Styli with Silicon Nitride ball Straight styli are designed to inspect simple features where direct, unobstructed contact with a measured surface is possible. A tungsten carbide stem provides exceptional rigidity, particularly for styli with small ball and stem diameters. Silicon nitride is similar to ruby in terms of its physical properties. Its lower coefficient of friction makes it ideal for use with most scanning applications,