Wafer Cleaving / Glass Breaking Pliers AFM and Scanning Probe Microscopy Calibration Scanning electron microscopes have a

Scanning electron microscopes have a pattern that will show significant differences between backscattered and secondary electron type I and type II images

Porous specimens such as felt with a poor discharge path may accept a track of glue over its surface to reduce such static

For standard grid materials such as Cu

Completely Gold Coated

Typical applications for these tweezers include microscopy preparation

Wafer Cleaving / Glass Breaking Pliers AFM and Scanning Probe Microscopy Calibration Scanning electron microscopes have aDESCRIPTION These light weight tweezers and pliers are non absorbent, have a positive, gentle grip, are non magnetic and the tips do not open when extra pressure is applied. They resist acetone, alcohol and most acids. Static dissipative (carbon fiber reinforced) versions are available for most models. Ideal for sample preparation, microscopy, etching, electronics, instrumentation, laboratories, forensics and delicate wafer handling. Especially useful